Microscopy

CERTeM R&D platform

• Digital microscope
• Inspection microscope

CERTeM + platform

• Confocal microscope
• Digital holographic microscope

Characterization platform

• SEM (Scanning Electron Microscopy) / EDX (Energy Dispersive X-ray spectrometry)
• FIB (Focused Ion Beam) / STEM (Scanning Transmission Electron Microscopy)  / EDX (Energy Dispersive X-ray spectrometry)
• AFM (Atomic Force Microscopy) (tapping and electrical modes)