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Microscopy

CERTeM R&D platform

  • Digital microscope
  • Inspection microscope

CERTeM + platform

  • Confocal microscope
  • Digital holographic microscope

Characterization platform

  • SEM (Scanning Electron Microscopy) / EDX (Energy Dispersive X-ray spectrometry)
  • FIB (Focused Ion Beam) / STEM (Scanning Transmission Electron Microscopy)  / EDX (Energy Dispersive X-ray spectrometry)
  • AFM (Atomic Force Microscopy) (tapping and electrical modes)