Characterization
Characterization platform
PHYSICAL CHARACTERIZATION
- X ray diffractometer
- HALL effect sensor
- Spectrometer FTIR - Fourier Transform InfraRed spectroscopy
- Four probes measurement - resistivity testing
- Granulometer
- Laser Doppler vibrometer
ELECTRICAL CHARACTERIZATION
- Probe station measurements I(V), C(V), impedancemetry, destructive tests CVS/LRVS (Linear Ramped Voltage Stress), RF
- ESD tester (ElectroStatic Discharge)
- DLTS - Deep Level Transient Spectroscopy
- Cryogenic probe station
- Wafer probing bench
- High voltage capacitance semiconductor analyzer
- TLP (Transmission Line Pulse) characterization system
CERTeM + platform
- Platform of multi-channels tests on high frequency acoustics MEMS
- Polarization and characterization platform of piezoelectric materials
- Impedencemetry bench
- Vibrometer laser UHF
- Optical and acoustic characterization bench
- Nanoscratch tester
- Nanoindentation
- Confocal microscope
- Digital holographic microscope
CERTeM R&D platform
- Spectroscopic ellipsometer
- Mechanical profilometer
- Mass spectrometer
- Digital microscope
- Inspection microscope
Contact
Jérôme BILLOUÉ
CERTeM scientific director
26 rue Pierre et Marie Curie
37100 Tours
Tel: 02 47 42 41 72
Mail: certem@univ-tours.fr
CERTeM scientific director
26 rue Pierre et Marie Curie
37100 Tours
Tel: 02 47 42 41 72
Mail: certem@univ-tours.fr