Characterization platform

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Physical characterization

  • X ray diffractometer
  • HALL effect sensor
  • Spectrometer FTIR - Fourier Transform InfraRed spectroscopy
  • Four probes measurement - resistivity testing
  • Granulometer
  • Laser Doppler vibrometer

Microscopy

  • SEM (Scanning Electron Microscopy) / EDX (Energy Dispersive X-ray spectrometry)
  • FIB (Focused Ion Beam) / STEM (Scanning Transmission Electron Microscopy)  / EDX (Energy Dispersive X-ray spectrometry)
  • AFM (Atomic Force Microscopy) (tapping and electrical modes)

Electrical characterization

  • Probe station measurements I(V), C(V), impedancemetry, destructive tests CVS/LRVS (Linear Ramped Voltage Stress), RF 
  • ESD tester (ElectroStatic Discharge)
  • DLTS - Deep Level Transient Spectroscopy
  • Cryogenic probe station
  • Wafer probing bench
  • High voltage capacitance semiconductor analyzer 
  • TLP (Transmission Line Pulse) characterization system