Characterization

Characterization platform

PHYSICAL CHARACTERIZATION

• X ray diffractometer
• HALL effect sensor
• Spectrometer FTIR - Fourier Transform InfraRed spectroscopy
• Four probes measurement - resistivity testing
• Granulometer
• Laser Doppler vibrometer

ELECTRICAL CHARACTERIZATION

• Probe station measurements I(V), C(V), impedancemetry, destructive tests CVS/LRVS (Linear Ramped Voltage Stress), RF 
• ESD tester (ElectroStatic Discharge)
• DLTS - Deep Level Transient Spectroscopy
• Cryogenic probe station
• Wafer probing bench
• High voltage capacitance semiconductor analyzer 
• TLP (Transmission Line Pulse) characterization system

CERTeM + platform

• Platform of multi-channels tests on high frequency acoustics MEMS
• Polarization and characterization platform of piezoelectric materials
• Impedencemetry bench
• Vibrometer laser UHF
• Optical and acoustic characterization bench
• Nanoscratch tester
• Nanoindentation 
• Confocal microscope
• Digital holographic microscope

CERTeM R&D platform

• Spectroscopic ellipsometer
• Mechanical profilometer
• Mass spectrometer
• Digital microscope
• Inspection microscope